Invention Grant
- Patent Title: Method for improved programming efficiency in flash memory cells
- Patent Title (中): 提高闪存单元编程效率的方法
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Application No.: US10229925Application Date: 2002-08-27
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Publication No.: US06850440B2Publication Date: 2005-02-01
- Inventor: Shi-Tron Lin , Wei-Fan Chen
- Applicant: Shi-Tron Lin , Wei-Fan Chen
- Applicant Address: TW Hsinchu
- Assignee: Winbond Electronics Corporation
- Current Assignee: Winbond Electronics Corporation
- Current Assignee Address: TW Hsinchu
- Agency: Townsend and Townsend and Crew LLP
- Main IPC: G11C16/04
- IPC: G11C16/04 ; G11C16/12

Abstract:
A method of operating a non-volatile memory device includes providing the non-volatile memory device with a body of first conductivity, a source region of second conductivity, a drain region of second conductivity on the body, and a control gate over the body adjacent to the source and drain regions. A first voltage of first polarity is applied to the control gate. A second voltage of first polarity is applied to the drain region, the second voltage being less than about 5.6 volts. A third voltage of second polarity is applied to the source region.
Public/Granted literature
- US20030112660A1 Method for improved programming efficiency in flash memory cells Public/Granted day:2003-06-19
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