发明授权
- 专利标题: Magnetic field measurement system
- 专利标题(中): 磁场测量系统
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申请号: US10844480申请日: 2004-05-13
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公开(公告)号: US06853185B2公开(公告)日: 2005-02-08
- 发明人: Akira Tsukamoto , Koichi Yokosawa , Daisuke Suzuki , Akihiko Kandori , Keiji Tsukada
- 申请人: Akira Tsukamoto , Koichi Yokosawa , Daisuke Suzuki , Akihiko Kandori , Keiji Tsukada
- 申请人地址: JP Tokyo
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 当前专利权人地址: JP Tokyo
- 代理机构: Mattingly, Stanger & Malur, P.C.
- 优先权: JP2003-139754 20030519
- 主分类号: A61B5/05
- IPC分类号: A61B5/05 ; G01R33/025 ; G01R33/035 ; G01R33/02
摘要:
A magnetic field measurement system for canceling an external field is provided, in which plurality of sensing magnetometers (3) for measuring a magnetic field signal in a direction perpendicular to the center axis of a cylindrical magnetic shield (1) are arranged in two dimensions on a plane parallel to the center axis and a reference magnetometer (4) for measuring the external field parallel to the center axis as a reference signal is disposed on a plane perpendicular to the plane parallel to the center axis. The reference signal multiplied by a specified factor is subtracted from a difference between signals from the adjacent sensing magnetometers (3). The magnetic field measurement system allows measurement of an extremely weak magnetic field by efficiently canceling the external field.
公开/授权文献
- US20040232912A1 MAGNETIC FIELD MEASUREMENT SYSTEM 公开/授权日:2004-11-25
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