Invention Grant
- Patent Title: Method of ion fragmentation in a multipole ion guide of a tandem mass spectrometer
- Patent Title (中): 串联质谱仪多极离子导向离子破碎的方法
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Application No.: US10441004Application Date: 2003-05-20
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Publication No.: US06858840B2Publication Date: 2005-02-22
- Inventor: Vadym D. Berkout , Vladimir M. Doroshenko
- Applicant: Vadym D. Berkout , Vladimir M. Doroshenko
- Applicant Address: US MD Columbia
- Assignee: Science & Engineering Services, Inc.
- Current Assignee: Science & Engineering Services, Inc.
- Current Assignee Address: US MD Columbia
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, P.C.
- Main IPC: B01D59/44
- IPC: B01D59/44 ; H01J49/00 ; H01J49/26 ; H01J49/40 ; H01J49/42
Abstract:
A system and method for mass analysis of an ion beam. The system includes a mass selector, at least one multipole ion guide, and a mass analyzer. In the system and method, precursor ions are selected with a desired mass to charge ratio. Electrons are injected into the multipole ion guide. The precursor ions are fragmented into product ions via electron capture dissociation from the injected electrons. The product ions are passed to a mass analyzer for a mass analysis.
Public/Granted literature
- US20040232324A1 Method of ion fragmentation in a multipole ion guide of a tandem mass spectrometer Public/Granted day:2004-11-25
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