Invention Grant
- Patent Title: Sintered polycrystalline gallium nitride and its production
- Patent Title (中): 烧结多晶氮化镓及其生产
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Application No.: US10001575Application Date: 2001-11-02
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Publication No.: US06861130B2Publication Date: 2005-03-01
- Inventor: Mark P. D'Evelyn , David C. Pender , Suresh S. Vagarali , Dong-Sil Park
- Applicant: Mark P. D'Evelyn , David C. Pender , Suresh S. Vagarali , Dong-Sil Park
- Applicant Address: US MA Pittsfield
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US MA Pittsfield
- Main IPC: C04B35/58
- IPC: C04B35/58 ; B28B3/00 ; C01B20060101 ; C01B21/06 ; C23C20060101 ; C23C14/34 ; H01L21/20 ; H01L33/00

Abstract:
Polycrystalline gallium nitride (GaN) characterized by having the atomic fraction of gallium ranging from between about 49% to 55%, an apparent density of between about 5.5 and 6.1 g/cm3, and a Vickers hardness of above about 1 GPa. Polycrystalline GaN can be made by hot isostatic pressing (HIPing) at a temperature ranging from about 1150° C. to 1300° C. and a pressure ranging from between about 1 and 10 Kbar. Alternatively, polycrystalline GaN can be made by high pressure/high temperature (HP/HT) sintering at a temperature ranging from about 1200° to 1800° C. and a pressure ranging from about 5 to 80 Kbar.
Public/Granted literature
- US20030086856A1 Sintered polycrystalline gallium nitride and its production Public/Granted day:2003-05-08
Information query
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