发明授权
- 专利标题: Neutral particle beam processing apparatus
- 专利标题(中): 中性粒子束处理装置
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申请号: US10471741申请日: 2002-03-22
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公开(公告)号: US06861643B2公开(公告)日: 2005-03-01
- 发明人: Katsunori Ichiki , Kazuo Yamauchi , Hirokuni Hiyama , Seiji Samukawa
- 申请人: Katsunori Ichiki , Kazuo Yamauchi , Hirokuni Hiyama , Seiji Samukawa
- 申请人地址: JP Ohta-ku
- 专利权人: Ebara Corporation
- 当前专利权人: Ebara Corporation
- 当前专利权人地址: JP Ohta-ku
- 代理机构: Westerman, Hattori, Daniels & Adrian, LLP
- 优先权: JP2001-088898 20010326
- 国际申请: PCTJP02/02752 WO 20020322
- 国际公布: WO0207804 WO 20021003
- 主分类号: G21K5/04
- IPC分类号: G21K5/04 ; B01J19/08 ; C23C14/32 ; C23C16/50 ; H01J37/317 ; H01J37/32 ; H01L21/205 ; H01L21/302 ; H01L21/304 ; H01L21/3065 ; H05H1/46 ; H01L21/306 ; H05H3/00
摘要:
A neutral particle beam processing apparatus comprises a process gas inlet port (11) for introducing a process gas into a vacuum chamber (1), a plasma generating chamber (2) for generating positive ions and electrons from the introduced process gas, and a negative ion generating chamber (3) for attaching electrons generated in the plasma generating chamber to the residual gas to generate negative ions. The neutral particle beam processing apparatus further comprises an ion extracting portion (4) for extracting the positive ions or the negative ions and accelerating the positive ions or the negative ions in a predetermined direction, and a neutralizing chamber (5) for neutralizing an ion beam generated by the ion extracting portion (4) to generate a neutral particle beam. The neutral particle beam generated in the neutralizing chamber (5) is applied to a workpiece (X).
公开/授权文献
- US20040108470A1 Neutral particle beam processing apparatus 公开/授权日:2004-06-10
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