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    DEVICE FOR MEASURING A QUANTITY REPRESENTATIVE OF A POPULATION OF COLD ATOMS AND ASSOCIATED SENSOR
    2.
    发明公开
    DEVICE FOR MEASURING A QUANTITY REPRESENTATIVE OF A POPULATION OF COLD ATOMS AND ASSOCIATED SENSOR 审中-公开

    公开(公告)号：US20230332892A1

    公开(公告)日：2023-10-19

    申请号：US18011513

    申请日：2021-06-18

    申请人： CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE ,  OBSERVATOIRE DE PARIS ,  SORBONNE UNIVERSITE

    发明人： Carlos GARRIDO ALZAR

    IPC分类号： G01C19/64 ,  G21K1/00 ,  H05H3/00 ,  H03L7/26

    CPC分类号： G01C19/64 ,  G21K1/006 ,  H03L7/26 ,  H05H3/00

    摘要： A device for measuring a quantity representative of a population (N) of cold atoms, the cold atoms being located in a cloud of cold atoms to be analyzed, the device includes a microwave source configured to generate an incident signal at a predetermined signal frequency, a microwave guide configured to propagate the incident signal and an antenna configured to emit the incident signal to the cloud of cold atoms and its environment, the antenna and the microwave guide also being able to recover an atomic reflected signal resulting from a reflection of the incident signal by the cloud and its environment, and which propagates in the waveguide in the opposite direction to the incident signal, a splitting device coupled to the microwave guide and configured to extract at least part of the atomic reflected signal, a detector configured to detect the atomic reflected signal extracted by the splitting device, the quantity representative of the population of cold atoms (N) being obtained from a detected value of the atomic reflected signal and from a detected value of a signal reflected by the environment in the absence of the cloud, called reference reflected signal.

    On-chip trapped ultracold atom sensor allowing rotational velocity to be measured
    8.
    发明授权
    On-chip trapped ultracold atom sensor allowing rotational velocity to be measured 有权

    公开(公告)号：US10375813B2

    公开(公告)日：2019-08-06

    申请号：US15778605

    申请日：2016-11-24

    申请人： THALES

    发明人： Matthieu Dupont-Nivet ,  Sylvain Schwartz

    IPC分类号： G01C19/64 ,  H05H3/00

    摘要： Ultra-cold atom sensor for measuring a rotational velocity along a measurement axis comprises: means designed to generate a first and a second ultra-cold atom trap, one trap making it possible to immobilize a cloud of ultra-cold atoms in an internal state different from the other trap, at a predetermined distance from the measurement plane, the means comprising, at least one first and one second waveguide that are designed to propagate microwaves with angular frequencies ωa and ωb, the waveguides being non-secant and positioned symmetrically about an axis called the axis of symmetry, conductive wires integrated into the chip and designed to be flowed through by DC currents, the means being configured to modify the energy of the ultra-cold atoms in such a way as to create a potential minimum for the ultra-cold atoms in the internal state |a> and a potential minimum for the ultra-cold atoms in the internal state |b>, thus forming the first and second ultra-cold atom traps, and to move the traps along a closed path, traveled in one direction by the ultra-cold atoms of the first trap and in the opposite direction by the ultra-cold atoms of the second trap.

    Composite beam apparatus
    9.
    发明授权
    Composite beam apparatus 有权

    公开(公告)号：US10204759B2

    公开(公告)日：2019-02-12

    申请号：US15696445

    申请日：2017-09-06

    申请人： HITACHI HIGH-TECH SCIENCE CORPORATION

    发明人： Tatsuya Asahata

    IPC分类号： H01J37/02 ,  H01J37/305 ,  H01J37/141 ,  H01J37/29 ,  H05H3/00

    摘要： A composite beam apparatus includes an electron beam column for irradiating an electron beam onto a sample, a focused ion beam column for irradiating a focused ion beam onto the sample to form a cross section, and a neutral particle beam column having an acceleration voltage set lower than that of the focused ion beam column for irradiating a neutral particle beam onto the sample to perform finish processing of the cross section. The electron beam column, the focused ion beam column, and the neutral particle beam column are arranged such that the beams of the columns cross each other at an irradiation point. A controller controls the electron beam column to irradiate and scan the electron beam on the sample during cross section processing by the focused ion beam column and during finish processing by the neutral particle beam column. The composite beam apparatus is capable of suppressing the influence of charge build-up, or electric field or magnetic field leakage from an electron beam column, when subjecting a sample to cross-section processing with a focused ion beam and then performing finishing processing with another beam.

    COMPOSITE BEAM APPARATUS
    10.
    发明申请
    COMPOSITE BEAM APPARATUS 审中-公开

    公开(公告)号：US20180076001A1

    公开(公告)日：2018-03-15

    申请号：US15696445

    申请日：2017-09-06

    申请人： HITACHI HIGH-TECH SCIENCE CORPORATION

    发明人： Tatsuya ASAHATA

    IPC分类号： H01J37/02 ,  H05H3/00 ,  H01J37/29 ,  H01J37/141 ,  H01J37/305

    CPC分类号： H01J37/026 ,  H01J37/141 ,  H01J37/292 ,  H01J37/3056 ,  H01J2237/1405 ,  H05H3/00

    摘要： Disclosed is a composite beam apparatus capable of suppressing the influence of charge build-up, or electric field or magnetic field leakage from an electron beam column when subjecting a sample to cross-section processing with a focused ion beam and then performing finishing processing with another beam. The Composite beam apparatus includes: an electron beam column irradiating an electron beam onto a sample; a focused ion beam column irradiating a focused ion beam onto the sample to form a cross section; a neutral particle beam column having an acceleration voltage set lower than that of the focused ion beam column, and irradiating a neutral particle beam onto the sample to perform finish processing of the cross section, wherein the electron beam column, the focused ion beam column, and the neutral particle beam column are arranged such that the beams of the columns cross each other at an irradiation point.