发明授权
- 专利标题: Semiconductor device and method of fabricating the same
- 专利标题(中): 半导体装置及其制造方法
-
申请号: US10357333申请日: 2003-02-04
-
公开(公告)号: US06864127B2公开(公告)日: 2005-03-08
- 发明人: Shunpei Yamazaki , Hideto Ohnuma , Tamae Takano , Hisashi Ohtani
- 申请人: Shunpei Yamazaki , Hideto Ohnuma , Tamae Takano , Hisashi Ohtani
- 申请人地址: JP Kanagawa-ken
- 专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人地址: JP Kanagawa-ken
- 代理机构: Robinson Intellectual Property Law Office, P.C.
- 代理商 Eric J. Robinson
- 优先权: JP9-123283 19970425; JP9-123284 19970425
- 主分类号: G02B5/30
- IPC分类号: G02B5/30 ; G02B27/00 ; G02B27/01 ; G02F1/1362 ; H01L21/336 ; H01L21/77 ; H01L21/84 ; H01L27/12 ; H01L27/13 ; H01L21/00
摘要:
There are disclosed techniques for providing a simplified process sequence for fabricating a semiconductor device. The sequence starts with forming an amorphous film containing silicon. Then, an insulating film having openings is formed on the amorphous film. A catalytic element is introduced through the openings to effect crystallization. Thereafter, a window is formed in the insulating film, and P ions are implanted. This process step forms two kinds of regions simultaneously (i.e., gettering regions for gettering the catalytic element and regions that will become the lower electrode of each auxiliary capacitor later).
公开/授权文献
- US20030138996A1 Semiconductor device and method of fabricating the same 公开/授权日:2003-07-24
信息查询