发明授权
- 专利标题: Accurate small-spot spectrometry systems and methods
- 专利标题(中): 精确的小光谱分析系统和方法
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申请号: US10796322申请日: 2004-03-09
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公开(公告)号: US06870617B2公开(公告)日: 2005-03-22
- 发明人: Adam Norton , Abdurrahman Sezginer , Fred E. Stanke , Rodney Smedt
- 申请人: Adam Norton , Abdurrahman Sezginer , Fred E. Stanke , Rodney Smedt
- 申请人地址: US CA Fremont
- 专利权人: Therma-Wave, Inc.
- 当前专利权人: Therma-Wave, Inc.
- 当前专利权人地址: US CA Fremont
- 代理机构: Stallman & Pollock LLP
- 主分类号: G01J3/08
- IPC分类号: G01J3/08 ; G01J3/42 ; G01N21/55
摘要:
The invention is a method and apparatus for determining characteristics of a sample. The system and method provide for detecting a monitor beam reflected off a mirror, where the monitor beam corresponds to the intensity of light incident upon the sample. The system and method also provide for detecting a measurement beam, where the measurement beam has been reflected off the sample being characterized. Both the monitor beam and the measurement beam are transmitted through the same transmission path, and detected by the same detector. Thus, potential sources of variations between the monitor beam and the measurement beam which are not due to the characteristics of the sample are minimized. Reflectivity information for the sample can be determined by comparing data corresponding to the measurement beam relative to data corresponding the monitor beam.
公开/授权文献
- US20040174524A1 Accurate small-spot spectrometry systems and methods 公开/授权日:2004-09-09
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