Invention Grant
US06871306B2 Method and device for reading and for checking the time position of data response signals read out from a memory module to be tested
有权
用于读取和检查从要测试的存储器模块读出的数据响应信号的时间位置的方法和装置
- Patent Title: Method and device for reading and for checking the time position of data response signals read out from a memory module to be tested
- Patent Title (中): 用于读取和检查从要测试的存储器模块读出的数据响应信号的时间位置的方法和装置
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Application No.: US09907692Application Date: 2001-07-18
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Publication No.: US06871306B2Publication Date: 2005-03-22
- Inventor: Wolfgang Ernst , Gunnar Krause , Justus Kuhn , Jens Lüpke , Jochen Müller , Peter Pöchmüller , Michael Schittenhelm
- Applicant: Wolfgang Ernst , Gunnar Krause , Justus Kuhn , Jens Lüpke , Jochen Müller , Peter Pöchmüller , Michael Schittenhelm
- Applicant Address: DE Munich
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Munich
- Agent Laurence A. Greenberg; Werner H. Stemer; Ralph E. Locher
- Priority: DE10034852 20000718
- Main IPC: G11C29/50
- IPC: G11C29/50 ; G11C29/56 ; G11C29/00

Abstract:
A method and a device for reading and for checking the time position of a data response read out from a memory module to be tested, in particular a DRAM memory operating in DDR operation. In a test receiver, the data response from the memory module to be tested is latched into a data latch with a data strobe response signal that has been delayed. A symmetrical clock signal is generated as a calibration signal. The calibration signal is used to calibrate the time position of the delayed data strobe response signal with respect to the data response. The delayed data strobe response signal is used for latching the data response. The delay time is programmed into a delay device during the calibration operation and also supplies a measure for testing precise time relationships between the data strobe response signal (DQS) and the data response.
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