发明授权
- 专利标题: Externally programmable antifuse
- 专利标题(中): 外部可编程反熔丝
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申请号: US10167802申请日: 2002-06-11
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公开(公告)号: US06888398B2公开(公告)日: 2005-05-03
- 发明人: Sean M. Koehl , Dean Samara-Rubio , Ding Yi
- 申请人: Sean M. Koehl , Dean Samara-Rubio , Ding Yi
- 申请人地址: US CA Santa Clara
- 专利权人: Intel Corporation
- 当前专利权人: Intel Corporation
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Blakely, Sokoloff, Taylor & Zafman LLP
- 主分类号: G11C17/18
- IPC分类号: G11C17/18 ; H01L23/525 ; H01H37/76
摘要:
An antifuse circuit includes a capacitor and a detector. The capacitor is formed using standard MOS processes in a well. The gate serves as one electrode and the well serving as another electrode of the capacitor. The antifuse is programmed by externally provided radiation that can rupture the gate oxide so that the gate and well can contact each other. The gate and well form a PN junction, transforming the capacitor into a diode. The diode provides the conductive path of the programmed antifuse.
公开/授权文献
- US20020180511A1 Externally programmable antifuse 公开/授权日:2002-12-05
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