Invention Grant
- Patent Title: Method of analyzing particles suspended in liquid and liquid-suspended particle analyzer for carrying out the method
- Patent Title (中): 分析悬浮在液体和液体悬浮颗粒分析仪中的颗粒进行分析的方法
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Application No.: US10294747Application Date: 2002-11-15
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Publication No.: US06892142B2Publication Date: 2005-05-10
- Inventor: Kazuo Takeuchi , Kikuo Okuyama , Wuled Lenggoro
- Applicant: Kazuo Takeuchi , Kikuo Okuyama , Wuled Lenggoro
- Applicant Address: JP Wako
- Assignee: Riken
- Current Assignee: Riken
- Current Assignee Address: JP Wako
- Agency: Birch Stewart Kolasch & Birch, LLP
- Priority: JP2001-349667 20011115
- Main IPC: G01N27/60
- IPC: G01N27/60 ; G01N15/02 ; G01N15/06 ; G01N15/10 ; G01N31/00 ; G01N11/00

Abstract:
A liquid-suspended particle analyzer includes: a fine liquid droplet producing device for atomizing a liquid pumped from a sample container by a fixed-displacement pump to produce fine liquid droplets suspended in a carrier gas; an evaporator for evaporating the liquid parts of the fine liquid droplets to produce an aerosol of the carrier gas and particles suspended in the carrier gas; a differential mobility classifier for classifying the particles of the aerosol by particle size according to mobility; and a Faraday cup electrometer for counting the respective numbers of the particles of the particle groups classified by particle size by the differential mobility classifier so as to determine the respective particle concentrations of the groups. The fine liquid droplets producing device includes an electrospraying device adapted to convert the liquid supplied by the liquid supply device into charged fine liquid droplets; and an atomizer adapted to suspend the charged fine liquid droplets produced by the electrospraying device in the carrier gas.
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