发明授权
US06893532B1 Method and apparatus for processing fine particle dust in plasma
失效
用于处理等离子体中细粒尘埃的方法和装置
- 专利标题: Method and apparatus for processing fine particle dust in plasma
- 专利标题(中): 用于处理等离子体中细粒尘埃的方法和装置
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申请号: US10019245申请日: 1999-06-29
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公开(公告)号: US06893532B1公开(公告)日: 2005-05-17
- 发明人: Noriyoshi Sato , Satoru Iizuka , Giichiro Uchida
- 申请人: Noriyoshi Sato , Satoru Iizuka , Giichiro Uchida
- 申请人地址: JP
- 专利权人: Tohoku Techno Arch Co., Ltd.
- 当前专利权人: Tohoku Techno Arch Co., Ltd.
- 当前专利权人地址: JP
- 代理机构: Hayes Soloway P.C.
- 国际申请: PCTJP99/03501 WO 19990629
- 国际公布: WO0101467 WO 20010104
- 主分类号: H01J37/32
- IPC分类号: H01J37/32 ; H01L21/3065
摘要:
An apparatus for processing particulate dust when a substrate is arranged in a high vacuum enclosure, plasma is generated in the high vacuum enclosure, and a reactive material is introduced into the high vacuum enclosure to perform processing of the substrate. At least one collecting electrode is provided around the substrate in the high vacuum enclosure other than the electrode that generates plasma, and particulates generated in plasma are efficiently removed by applying a predetermined electric potential of a direct-current or an alternating current to the collecting electrode, and thus a deposition problem onto an inner wall of the vacuum enclosure and a deterioration problem of processing accuracy and a film quality associated with flowing of the particulates onto the substrate are solved.
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