Invention Grant
US06894920B2 Magnetic random access memory (MRAM) for spontaneous hall effect and method of writing and reading data using the MRAM
有权
用于自发厅效应的磁随机存取存储器(MRAM)和使用MRAM写入和读取数据的方法
- Patent Title: Magnetic random access memory (MRAM) for spontaneous hall effect and method of writing and reading data using the MRAM
- Patent Title (中): 用于自发厅效应的磁随机存取存储器(MRAM)和使用MRAM写入和读取数据的方法
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Application No.: US10465602Application Date: 2003-06-20
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Publication No.: US06894920B2Publication Date: 2005-05-17
- Inventor: Tae-wan Kim , Kee-won Kim , Wan-jun Park , I-hun Song , Sang-jin Park
- Applicant: Tae-wan Kim , Kee-won Kim , Wan-jun Park , I-hun Song , Sang-jin Park
- Applicant Address: KR Kyungki-do
- Assignee: Samsung Electronics Co, Ltd.
- Current Assignee: Samsung Electronics Co, Ltd.
- Current Assignee Address: KR Kyungki-do
- Agency: Lee, Sterba & Morse, P.C.
- Priority: KR10-2002-35141 20020622
- Main IPC: H01L27/105
- IPC: H01L27/105 ; G11C11/15 ; G11C11/18 ; H01L21/8246 ; H01L43/06 ; G11C11/00

Abstract:
A magnetic RAM (MRAM) using a thermo-magnetic spontaneous Hall effect includes a MOS transistor formed on a substrate; a heating layer formed above the MOS transistor and connected to a source region of the MOS transistor; a memory layer having a data write area to which data is written, the data write area being formed on the heating means; a bit line formed on the data write area; an upper insulating film formed on the bit line and the memory layer; and a write line formed on the upper insulating film so that a magnetic field necessary for writing data is generated in at least the data write area of the memory layer. The MRAM writes or reads data using the fact that a spontaneous Hall voltage greatly differs according to the magnetization state of a memory layer, thereby providing the device a high data sensing margin.
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