发明授权
- 专利标题: Stokes parameter measurement device and method
- 专利标题(中): 斯托克斯参数测量装置及方法
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申请号: US10347842申请日: 2003-01-16
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公开(公告)号: US06909506B2公开(公告)日: 2005-06-21
- 发明人: Takeshi Takagi , Kazuhiro Ikeda , Tatsuya Hatano , Hiroshi Matsuura
- 申请人: Takeshi Takagi , Kazuhiro Ikeda , Tatsuya Hatano , Hiroshi Matsuura
- 申请人地址: JP Tokyo
- 专利权人: The Furukawa Electric Co., Ltd.
- 当前专利权人: The Furukawa Electric Co., Ltd.
- 当前专利权人地址: JP Tokyo
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, P.C.
- 优先权: JP2002-8330 20020117; JP2002-201268 20020710
- 主分类号: G01J4/00
- IPC分类号: G01J4/00
摘要:
An object is to accurately measure the Stokes parameters, without the occurrence of polarization fluctuations or PDL during the splitting of the incident light. When the incident light is made incident on a first-stage prism, the light is split into two first splitting light rays. Next, the first split light rays are respectively incident on a pair of prisms of a second stage. Each of the pair of first split light rays is split into two rays by a second-stage prism, to obtain four second split light rays.
公开/授权文献
- US20030156286A1 Stokes parameter measurement device and method 公开/授权日:2003-08-21