发明授权
US06911362B2 Methods for forming electronic devices including capacitor structures
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用于形成包括电容器结构的电子器件的方法
- 专利标题: Methods for forming electronic devices including capacitor structures
- 专利标题(中): 用于形成包括电容器结构的电子器件的方法
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申请号: US10635195申请日: 2003-08-06
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公开(公告)号: US06911362B2公开(公告)日: 2005-06-28
- 发明人: Ki-Nam Kim , Yoon-Jong Song , Heung-Jin Joo
- 申请人: Ki-Nam Kim , Yoon-Jong Song , Heung-Jin Joo
- 申请人地址: KR Kyungki-do
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Kyungki-do
- 代理机构: Myers Bigel Sibley & Sajovec
- 优先权: KR10-2002-0053116 20020904
- 主分类号: H01L27/105
- IPC分类号: H01L27/105 ; H01L21/8246 ; H01L27/115 ; H01L21/8242
摘要:
Methods for forming an electronic device can include forming a capacitor structure on a portion of a substrate with the capacitor structure including a first electrode on the substrate, a capacitor dielectric on the first electrode, a second electrode on the dielectric, and a hard mask on the second electrode. More particularly, the capacitor dielectric can be between the first and second electrodes, the first electrode and the capacitor dielectric can be between the second electrode and the substrate, and the first and second electrodes and the capacitor dielectric can be between the hard mask and the substrate. An interlayer dielectric layer can be formed on the hard mask and on portions of the substrate surrounding the capacitor structure, and portions of the interlayer dielectric layer can be removed to expose the hard mask while maintaining portions of the interlayer dielectric layer on portions of the substrate surrounding the capacitor structure. The hard mask can then be removed thereby exposing portions of the second electrode while maintaining the portions of the interlayer dielectric layer on portions of the substrate surrounding the capacitor.
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