发明授权
- 专利标题: Method of manufacturing memory with nano dots
- 专利标题(中): 用纳米点制造记忆的方法
-
申请号: US10743377申请日: 2003-12-23
-
公开(公告)号: US06913984B2公开(公告)日: 2005-07-05
- 发明人: In-sook Kim , Sun-ae Seo , In-kyeong Yoo , Soo-hwan Jeong
- 申请人: In-sook Kim , Sun-ae Seo , In-kyeong Yoo , Soo-hwan Jeong
- 申请人地址: KR Gyeonggi-do
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Gyeonggi-do
- 代理机构: Lee & Morse, P.C.
- 优先权: KR10-2002-0082387 20021223
- 主分类号: B82B1/00
- IPC分类号: B82B1/00 ; H01L21/28 ; H01L21/8247 ; H01L27/115 ; H01L29/06 ; H01L29/423 ; H01L29/788 ; H01L29/792 ; H01L21/76
摘要:
A method of fabricating memory with nano dots includes sequentially depositing a first insulating layer, a charge storage layer, a sacrificial layer, and a metal layer on a substrate in which source and drain electrodes are formed, forming a plurality of holes on the resultant structure by anodizing the metal layer and oxidizing portions of the sacrificial layer that are exposed through the holes, patterning the charge storage layer to have nano dots by removing the oxidized metal layer, and etching the sacrificial layer and the charge storage layer using the oxidized sacrificial layer as a mask, and removing the oxidized sacrificial layer, depositing a second insulating layer and a gate electrode on the patterned charge storage layer, and patterning the first insulating layer, the patterned charge storage layer, the second insulating layer, and the gate electrode to a predetermined shape, for forming memory having uniformly distributed nano-scale storage nodes.
公开/授权文献
- US20040137704A1 Method of manufacturing memory with nano dots 公开/授权日:2004-07-15
信息查询