Invention Grant
US06920074B2 Method for reading a memory cell in a semiconductor memory, and semiconductor memory
失效
用于读取半导体存储器中的存储单元的方法和半导体存储器
- Patent Title: Method for reading a memory cell in a semiconductor memory, and semiconductor memory
- Patent Title (中): 用于读取半导体存储器中的存储单元的方法和半导体存储器
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Application No.: US10642906Application Date: 2003-08-18
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Publication No.: US06920074B2Publication Date: 2005-07-19
- Inventor: Helmut Fischer , Kazimierz Szczypinski
- Applicant: Helmut Fischer , Kazimierz Szczypinski
- Applicant Address: DE Munich
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Munich
- Agent Laurence A. Greenberg; Werner H. Stemer; Ralph E. Locher
- Priority: DE10107314 20010216
- Main IPC: G11C11/409
- IPC: G11C11/409 ; G11C7/06 ; G11C11/401 ; G11C7/00

Abstract:
In a semiconductor memory, there is capacitive coupling between bit lines that largely run in parallel. Outer sections of the bit lines are connected via respective switches to a sense amplifier arranged between the switches. When a memory cell is being read, the capacitive interference by other bit lines that are not coupled to the memory cell being read is kept as low as possible before the start of amplification by the sense amplifier by turning on the switches in that bit line. During the amplification phase, the remote outer section of that bit line is disconnected using the appropriate switch. In one embodiment, the capacitance of the bit line that is not connected to the memory cell to be read is increased further by additionally activating a precharging circuit.
Public/Granted literature
- US20040037129A1 Method for reading a memory cell in a semiconductor memory, and semiconductor memory Public/Granted day:2004-02-26
Information query
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