发明授权
- 专利标题: Method for cleaning a plasma chamber
- 专利标题(中): 清洁等离子体室的方法
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申请号: US10444571申请日: 2003-05-22
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公开(公告)号: US06926014B2公开(公告)日: 2005-08-09
- 发明人: Chao-Yun Cheng , Shin-Jien Kuo , Chih-Chung Chuang , Shu-Feng Wu
- 申请人: Chao-Yun Cheng , Shin-Jien Kuo , Chih-Chung Chuang , Shu-Feng Wu
- 申请人地址: TW Hsinchu
- 专利权人: Au Optronics Corp.
- 当前专利权人: Au Optronics Corp.
- 当前专利权人地址: TW Hsinchu
- 代理机构: Ladas & Parry LLP
- 优先权: TW91134944A 20021202
- 主分类号: B08B7/00
- IPC分类号: B08B7/00 ; B08B9/093 ; C25F1/00
摘要:
A method for cleaning a plasma chamber after metal etching. First, a substrate having a metal layer thereon is placed in a plasma chamber. Next, the metal layer is etched. Finally, the substrate is removed from the plasma chamber to perform a dry cleaning which includes the following steps. First, the inner wall of the plasma chamber is cleaned by plasma etching using oxygen as a process gas. Next, the top and bottom electrode plates in the plasma chamber are cleaned by plasma etching using chlorine and boron chloride as process gases. Next, the inner wall of the plasma chamber is cleaned again by plasma etching using sulfur hexafluoride and oxygen as process gases. Finally, oxygen and helium used as purging gases are injected into the plasma chamber and exhausted from therein.
公开/授权文献
- US20040103914A1 Method for cleaning a plasma chamber 公开/授权日:2004-06-03
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