发明授权
- 专利标题： Device for measuring aberration refraction of the eye
- 专利标题（中）： 用于测量眼睛的像差折射的装置
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申请号： US10137720申请日： 2002-05-01
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公开(公告)号： US06932475B2公开(公告)日： 2005-08-23
- 发明人: Vasyl V. Molebny , Ioannis Pallikaris , Igor Chyzh , Vyacheslav Sokurenko , Leonidas Naoumidis , Youssef Wakil
- 申请人： Vasyl V. Molebny , Ioannis Pallikaris , Igor Chyzh , Vyacheslav Sokurenko , Leonidas Naoumidis , Youssef Wakil
- 申请人地址： US TX Houston
- 专利权人： Tracey Technologies, L.L.C.
- 当前专利权人： Tracey Technologies, L.L.C.
- 当前专利权人地址： US TX Houston
- 代理机构： Osha & May L.L.P.
- 代理商 John W. Montgomery
- 主分类号： A61B3/10
- IPC分类号： A61B3/10 ; A61B3/103 ; A61B3/107
摘要：
An instrument for measuring aberration refraction of an eye is provided, having: a lens system defining an instrument optical axis and an alignment device for aligning the visual axis of the eye with the instrument optical axis. A light source (1) produces a probing beam that is projected through the lens system parallel to the instrument optical axis and is selectably positionable partially off-set from the instrument optical axis for entering the eye (15) parallel to the instrument optical axis at a plurality of locations on the cornea of the eye. A photodetector (19) measures the position of probing beam light scattered back from the retina of the eye to measure aberration refraction of the eye at a plurality of locations.
公开/授权文献
- US20030011745A1 Device for measuring aberration refraction of the eye 公开/授权日：2003-01-16