- 专利标题: Method of making a semiconductor transistor
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申请号: US10917165申请日: 2004-08-11
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公开(公告)号: US06933589B2公开(公告)日: 2005-08-23
- 发明人: Anand S. Murthy , Boyan Boyanov , Ravindra Soman , Robert S. Chau
- 申请人: Anand S. Murthy , Boyan Boyanov , Ravindra Soman , Robert S. Chau
- 申请人地址: US CA Santa Clara
- 专利权人: Intel Corporation
- 当前专利权人: Intel Corporation
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Blakely, Sokoloff, Taylor & Zafman LLP
- 主分类号: H01L21/225
- IPC分类号: H01L21/225 ; H01L21/336 ; H01L21/8238 ; H01L29/165 ; H01L29/45 ; H01L29/78 ; H01L31/117 ; H01L31/0288
摘要:
Transistors are manufactured by growing germanium source and drain regions, implanting dopant impurities into the germanium, and subsequently annealing the source and drain regions so that the dopant impurities diffuse through the germanium. The process is simpler than a process wherein germanium is insitu doped with p-type or n-type impurities. The dopant impurities diffuse easily through the germanium but not easily through underlying silicon, so that an interface between the germanium and silicon acts as a diffusion barrier and ensures positioning of the dopant atoms in the regions of the device where they improve transistor performance.
公开/授权文献
- US20050079660A1 Method of making a semiconductor transistor 公开/授权日:2005-04-14
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