Invention Grant
- Patent Title: Wavemeter having two interference elements
- Patent Title (中): 波形计有两个干扰元素
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Application No.: US10134578Application Date: 2002-04-29
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Publication No.: US06937346B2Publication Date: 2005-08-30
- Inventor: Bernd Nebendahl , Andreas Schmidt , Matthias Jaeger
- Applicant: Bernd Nebendahl , Andreas Schmidt , Matthias Jaeger
- Applicant Address: US CA Palo Alto
- Assignee: Agilent Technologies, Inc.
- Current Assignee: Agilent Technologies, Inc.
- Current Assignee Address: US CA Palo Alto
- Priority: EP01119892 20010817
- Main IPC: G01J3/26
- IPC: G01J3/26 ; G01J9/02 ; H01S5/0687 ; G01B9/02

Abstract:
A wavemeter for determining a wavelength of an incident optical beam comprises four optical components, each being arranged in the incident optical beam or in a part of it, providing a path with a respective effective optical length, and generating a respective optical beam with a respective optical power depending on the wavelength of the incident optical beam. The optical powers oscillate periodically with increasing wavelength, and a phase shift of approximately pi/2 is provided between two respective pairs of the four optical components. Respective power detectors are provided, each detecting a respective one of the optical powers. A wavelength allocator is provided for allocating a wavelength to the incident optical beam based on the wavelength dependencies of the detected first, second, third, and fourth optical powers.
Public/Granted literature
- US20030035121A1 Wavemeter having two interference elements Public/Granted day:2003-02-20
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