发明授权
- 专利标题: Synthetic free layer for CPP GMR
- 专利标题(中): CPP GMR的合成自由层
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申请号: US10167859申请日: 2002-06-11
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公开(公告)号: US06953601B2公开(公告)日: 2005-10-11
- 发明人: Min Li , Simon Liao , Kochan Ju
- 申请人: Min Li , Simon Liao , Kochan Ju
- 申请人地址: US CA Milpitas
- 专利权人: Headway Technologies, Inc.
- 当前专利权人: Headway Technologies, Inc.
- 当前专利权人地址: US CA Milpitas
- 代理商 George O. Saile; Stephen B. Ackerman
- 主分类号: G11B5/39
- IPC分类号: G11B5/39 ; H01F10/32 ; H01F41/30 ; H01L43/10 ; B05D5/00 ; G11B5/127
摘要:
Reduction of the free layer thickness in GMR devices is desirable in order to meet higher signal requirements, besides improving the GMR ratio itself. However, thinning of the free layer reduces the GMR ratio and leads to poor thermal stability. This problem has been overcome by making AP2 from an inverse GMR material and by changing the free layer from a single uniform layer to a ferromagnetic layer AFM (antiferromagnetically) coupled to a layer of inverse GMR material. Examples of alloys that may be used for the inverse GMR materials include FeCr, NiFeCr, NiCr, CoCr, CoFeCr, and CoFeV. Additionally, the ruthenium layer normally used to effect antiferromagnetic coupling can be replaced by a layer of chromium. A process to manufacture the structure is also described.
公开/授权文献
- US20030227724A1 Synthetic free layer for CPP GMR 公开/授权日:2003-12-11
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