A testing apparatus for flat-panel display is disclosed. The flat-panel display at least comprises a plurality of electrode lines and a plurality of driving circuits. The driving circuits are used to drive the electrode lines. The driving circuits and the testing apparatus are disposed on the opposite sides of the flat-panel display. The testing apparatus comprises a plurality of switching components and at least one shorting bar. The shorting bar electrically couples to the electrode lines through the switching components. When the switching components are thin film transistor, the switching components further comprise at least one switching line. The switching line electrically couples to the gates of the thin film transistors. The electrode lines are divided into several groups to electrically couple to the shorting bar and the switching line, for example.