发明授权
- 专利标题: Infrared measuring apparatus and method for on-line application in manufacturing processes
- 专利标题(中): 用于制造过程中在线应用的红外测量装置和方法
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申请号: US10264080申请日: 2002-10-03
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公开(公告)号: US06960769B2公开(公告)日: 2005-11-01
- 发明人: Gary Neil Burk , Thomas Michael Domin , Rodney Dale Maxson , Dennis Charles Daugherty , Steven Perry Sturm
- 申请人: Gary Neil Burk , Thomas Michael Domin , Rodney Dale Maxson , Dennis Charles Daugherty , Steven Perry Sturm
- 申请人地址: US OH Columbus, Inc.
- 专利权人: ABB Inc.
- 当前专利权人: ABB Inc.
- 当前专利权人地址: US OH Columbus, Inc.
- 代理机构: Steven & Showalter LLP
- 主分类号: G01N21/35
- IPC分类号: G01N21/35 ; G01N21/86 ; G01N21/89 ; G01N33/34 ; G02B26/04 ; G01J5/02
摘要:
A single vane shutter flag is asynchronously controlled so that a measuring system light source is interrupted for a minimum necessary amount of time for standardization/calibration and normalization of InGaAs system detectors. Source/detector hemispheres or serially connected randomly oriented fiber bundles homogenize light passing to the detectors. Light source testing is performed by measuring spectral power distributions at a plurality of light source power levels and comparing the measurements to baseline characteristics established for the light source. Calibration sample life is extended indefinitely by controlling the shutter flag to block source light except for short calibration time periods during which standard light levels are provided.
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