发明授权
- 专利标题: Method and apparatus for detecting setting defects in self-piercing rivet setting machine
- 专利标题(中): 自攻铆钉定型机设定缺陷检测方法及装置
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申请号: US10732686申请日: 2003-12-10
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公开(公告)号: US06961984B2公开(公告)日: 2005-11-08
- 发明人: Nobuharu Naito , Toshiaki Amano
- 申请人: Nobuharu Naito , Toshiaki Amano
- 申请人地址: US DE Newark
- 专利权人: Newfrey LLC
- 当前专利权人: Newfrey LLC
- 当前专利权人地址: US DE Newark
- 代理机构: Harness, Dickey & Pierce, P.L.C.
- 优先权: JP2001-185762 20010620
- 主分类号: B21J15/02
- IPC分类号: B21J15/02 ; B21J15/28 ; B23Q17/22
摘要:
In order to detect setting defects of a self-piercing rivet in a self-piercing rivet setting machine, on a graph having X-Y coordinates representing a rivet driven stroke and a rivet driving load, a normal upper limit curve 37 defining the upper limit of a normal setting range and a normal lower limit curve 38 defining the lower limit of the normal setting range are plotted to detect a conventionally detectable setting defects. Further, a defect upper limit curve 39 and a defect lower limit curve 41 which are obtained from an additional setting defect different from the conventionally detectable setting defects are plotted between the normal upper limit curve and the normal lower limit curve, so that the additional setting defect is detected when a plotted curve 45 of actual-measurement data of a rivet under a rivet driving operation lies between the defect upper and lower limit curves.
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