Invention Grant
- Patent Title: Testing of integrated circuits from design documentation
- Patent Title (中): 从设计文件测试集成电路
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Application No.: US10703729Application Date: 2003-11-07
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Publication No.: US06978216B2Publication Date: 2005-12-20
- Inventor: James D. Sweet
- Applicant: James D. Sweet
- Applicant Address: US CA Irvine
- Assignee: Broadcom Corporation
- Current Assignee: Broadcom Corporation
- Current Assignee Address: US CA Irvine
- Agency: McAndrews, Held & Malloy, Ltd.
- Main IPC: G01R31/3183
- IPC: G01R31/3183 ; G06F17/50 ; G06F19/00

Abstract:
One or more methods and systems of validating the operation of one or more register designs are presented. In one embodiment, the system utilizes a processor, an integrated circuit design simulator software, a storage media, a storage device, user interface, and a display. In one embodiment, the method includes executing a set of instructions operating on a register design parameter file to produce an output that is easily incorporated into the integrated circuit design simulator software. The output specifies one or more tests to be performed using the integrated circuit design simulator software. The one or more tests are subsequently performed to validate the register design. The method automates the incorporation of register design parameters into the integrated circuit design simulator software by way of executing a set of instructions that operates on the register design parameter file.
Public/Granted literature
- US20040204892A1 Testing of integrated circuits from design documentation Public/Granted day:2004-10-14
Information query
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