发明授权
- 专利标题: Method of producing semiconductor crystal
- 专利标题(中): 半导体晶体的制造方法
-
申请号: US11009020申请日: 2004-12-13
-
公开(公告)号: US06987072B2公开(公告)日: 2006-01-17
- 发明人: Yoshihiko Kanzawa , Teruhito Ohnishi , Ken Idota , Tohru Saitoh , Akira Asai
- 申请人: Yoshihiko Kanzawa , Teruhito Ohnishi , Ken Idota , Tohru Saitoh , Akira Asai
- 申请人地址: JP Osaka
- 专利权人: Matsushita Electric Industrial Co., Ltd.
- 当前专利权人: Matsushita Electric Industrial Co., Ltd.
- 当前专利权人地址: JP Osaka
- 代理机构: McDermott Will & Emery LLP
- 主分类号: H01L21/31
- IPC分类号: H01L21/31
摘要:
A method for fabricating a semiconductor crystal that has a first step for forming a semiconductor crystal layer (202) that contains carbon atoms and at least one kind of Group IV element other than carbon on a substrate (201), a second step for adding an impurity that is capable of reacting with oxygen to the semiconductor crystal layer (202), and a third step for removing the carbon atoms contained in the semiconductor crystal layer (202) by reacting the carbon with the impurity. This method makes it possible to fabricate a semiconductor crystal substrate in which the concentration of interstitial carbon atoms is satisfactorily reduced, thus resulting in excellent electrical properties when the substrate is applied to a semiconductor device.
公开/授权文献
- US20050092230A1 Method for fabricating a semiconductor crystal 公开/授权日:2005-05-05
信息查询
IPC分类: