Invention Grant
- Patent Title: Method of preventing junction leakage in field emission devices
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Application No.: US10191653Application Date: 2002-07-08
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Publication No.: US06987352B2Publication Date: 2006-01-17
- Inventor: James J. Hofmann , John K. Lee , David A. Cathey , Glen E. Hush
- Applicant: James J. Hofmann , John K. Lee , David A. Cathey , Glen E. Hush
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: TraskBritt
- Main IPC: H01J1/304
- IPC: H01J1/304
Abstract:
An apparatus for stabilizing the threshold voltage in an active matrix field emission device is disclosed. The apparatus includes the formation of radiation-blocking elements between a cathodoluminescent display screen of the FED and semiconductor junctions formed on a baseplate of the FED.
Public/Granted literature
- US20020175607A1 Method of preventing junction leakage in field emission devices Public/Granted day:2002-11-28
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