发明授权
- 专利标题: MEMS differential actuated nano probe and method for fabrication
- 专利标题(中): MEMS微分致动纳米探针和制造方法
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申请号: US10795407申请日: 2004-03-09
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公开(公告)号: US06995368B2公开(公告)日: 2006-02-07
- 发明人: Shih-Yi Wen , Hsiao-Wen Lee , Jui-Ping Weng , Ming-Hung Chen
- 申请人: Shih-Yi Wen , Hsiao-Wen Lee , Jui-Ping Weng , Ming-Hung Chen
- 申请人地址: TW Hsinchu
- 专利权人: Industrial Technology Research Institute
- 当前专利权人: Industrial Technology Research Institute
- 当前专利权人地址: TW Hsinchu
- 代理机构: Birch, Stewart, Kolasch & Birch, LLP
- 优先权: TW92128875A 20031017
- 主分类号: G21K7/00
- IPC分类号: G21K7/00
摘要:
A MEMS differential actuated nano probe includes four suspension beams arranged in parallel, a connecting base connecting to the suspension beams, a nano probe. Two of the suspension beams elongate due to thermal expansion to allow the deflection of the probe. By heating the suspension beams at different positions, the MEMS differential actuated nano probe can move in two directions with two degrees of freedom. The deflection of the MEMS differential actuated nano probe can be also achieved in piezoelectric or electrostatic way.
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