- 专利标题： Semiconductor device test arrangement with reassignable probe pads
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申请号： US10013789申请日： 2001-12-10
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公开(公告)号： US06998865B2公开(公告)日： 2006-02-14
- 发明人: Karen A. Bard , S. Sundar Kumar Iyer
- 申请人： Karen A. Bard , S. Sundar Kumar Iyer
- 申请人地址： US NY Armonk
- 专利权人： International Business Machines Corporation
- 当前专利权人： International Business Machines Corporation
- 当前专利权人地址： US NY Armonk
- 代理商 Joseph P. Abate
- 主分类号： G01R31/02
- IPC分类号： G01R31/02 ; G01R31/26
摘要：
A test arrangement includes a semiconductor device, a first conductive pad electrically connected to the semiconductor device, a second conductive pad, and a programmable fuse. The second conductive pad is electrically connected to the semiconductor device through the programmable fuse.