Invention Grant
- Patent Title: Membrane probe with anchored elements
- Patent Title (中): 带有锚定元件的膜探针
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Application No.: US11031859Application Date: 2005-01-07
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Publication No.: US07011531B2Publication Date: 2006-03-14
- Inventor: Frank D. Egitto , Keith J. Miller , Manh-Quan T. Nguyen
- Applicant: Frank D. Egitto , Keith J. Miller , Manh-Quan T. Nguyen
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Schmeiser, Olsen & Watts
- Agent William H. Steinberg
- Main IPC: H01R12/00
- IPC: H01R12/00

Abstract:
A structure and method to establish an electrical connection between a tester and an electrical component. A flexible dielectric layer has a first side and a second side. A through via extends through the first side and the second side of the dielectric layer. A blind via is placed in a position that is offset from the through via and extends laterally in a first direction from a section of the first through via to a section of the flexible dielectric layer. The blind via extends in a second direction from the first side of the flexible dielectric layer to a section of the flexible dielectric layer that is between the first side and the second side of the dielectric layer. An electrically conductive member extends through the through via and extends into the blind via, thereby filling the through via and the blind via. The electrically conductive member has a first surface and a second surface. Any distance between the first surface and the second surface is greater than a distance between the first side of the dielectric layer and the second side of the dielectric layer.
Public/Granted literature
- US20050121800A1 Membrane probe with anchored elements Public/Granted day:2005-06-09
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