发明授权
- 专利标题: Dynamic burn-in method and apparatus
- 专利标题(中): 动态老化方法和装置
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申请号: US10796035申请日: 2004-03-10
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公开(公告)号: US07023228B2公开(公告)日: 2006-04-04
- 发明人: Yoshihiro Maesaki , Hiroshi Teshigawara
- 申请人: Yoshihiro Maesaki , Hiroshi Teshigawara
- 申请人地址: JP Kawasaki
- 专利权人: Fujitsu Limited
- 当前专利权人: Fujitsu Limited
- 当前专利权人地址: JP Kawasaki
- 代理机构: Staas & Halsey LLP
- 优先权: JP2001-294159 20010926
- 主分类号: G01R31/26
- IPC分类号: G01R31/26
摘要:
In a dynamic burn-in apparatus wherein a signal output from a signal generator is input to a semiconductor device to be tested in the burn-in tank, a converter is arranged at the output of the signal generator. The converter increases, by N times, the frequency of the signal output from a signal generator. The signal having the increased frequency and output from the converter, is input to the semiconductor device to be tested in the burn-in tank when the burn-in is operated at high-speed. The frequency of the signal is converted to the higher frequency, and the signal having the higher frequency is provided to the semiconductor device. As the result, the burn-in can be done in a shorter time for a high-speed sophisticated semiconductor device.
公开/授权文献
- US20040169524A1 Dynamic burn-in method and apparatus 公开/授权日:2004-09-02