Invention Grant
- Patent Title: Device for measuring supply voltage and method thereof
- Patent Title (中): 用于测量电源电压的装置及其方法
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Application No.: US10893341Application Date: 2004-07-19
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Publication No.: US07030635B2Publication Date: 2006-04-18
- Inventor: Gwan-pyo Hong , Hyong-yong Lee
- Applicant: Gwan-pyo Hong , Hyong-yong Lee
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2003-0080686 20031114
- Main IPC: G01R31/02
- IPC: G01R31/02

Abstract:
A device for measuring voltage, including a voltage detecting portion for detecting a plurality of voltages and outputting a maximum voltage of the plurality of voltages, a voltage latching portion that receives a first output from the voltage detecting portion, and a voltage reading portion that receives a second output from the voltage latching portion. Another device for measuring voltage, including a supply voltage, a ground voltage, and first and second supply voltage measuring units connected in parallel to each other between the supply voltage and the ground voltage. A method for measuring voltage, including receiving a plurality of voltages, detecting a maximum voltage from the plurality of voltages, maintaining the detected maximum voltage, and outputting the maintained detected maximum voltage.
Public/Granted literature
- US20050104611A1 Device for measuring supply voltage and method thereof Public/Granted day:2005-05-19
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