公开(公告)号：US07030635B2

公开(公告)日：2006-04-18

申请号：US10893341

申请日：2004-07-19

Applicant: Gwan-pyo Hong ,  Hyong-yong Lee

Inventor： Gwan-pyo Hong ,  Hyong-yong Lee

IPC: G01R31/02

CPC classification number: G01R25/00

Abstract: A device for measuring voltage, including a voltage detecting portion for detecting a plurality of voltages and outputting a maximum voltage of the plurality of voltages, a voltage latching portion that receives a first output from the voltage detecting portion, and a voltage reading portion that receives a second output from the voltage latching portion. Another device for measuring voltage, including a supply voltage, a ground voltage, and first and second supply voltage measuring units connected in parallel to each other between the supply voltage and the ground voltage. A method for measuring voltage, including receiving a plurality of voltages, detecting a maximum voltage from the plurality of voltages, maintaining the detected maximum voltage, and outputting the maintained detected maximum voltage.

Abstract translation: 一种用于测量电压的装置，包括用于检测多个电压并输出多个电压的最大电压的电压检测部分，接收来自电压检测部分的第一输出的电压锁存部分和接收电压检测部分的电压读取部分 来自电压锁存部分的第二输出。 用于测量电压的另一个装置，包括电源电压，接地电压以及在电源电压和接地电压之间并联连接的第一和第二电源电压测量单元。 一种用于测量电压的方法，包括接收多个电压，从多个电压检测最大电压，维持检测到的最大电压，并输出维持的检测到的最大电压。

公开(公告)号：US20050104611A1

公开(公告)日：2005-05-19

申请号：US10893341

申请日：2004-07-19

Applicant: Gwan-pyo Hong ,  Hyong-yong Lee

Inventor： Gwan-pyo Hong ,  Hyong-yong Lee

IPC: G01R31/26 ,  G01R19/165 ,  G01R25/00 ,  G01R31/30 ,  G11C5/14 ,  G01R31/02

CPC classification number: G01R25/00

Abstract: A device for measuring voltage, including a voltage detecting portion for detecting a plurality of voltages and outputting a maximum voltage of the plurality of voltages, a voltage latching portion that receives a first output from the voltage detecting portion, and a voltage reading portion that receives a second output from the voltage latching portion. Another device for measuring voltage, including a supply voltage, a ground voltage, and first and second supply voltage measuring units connected in parallel to each other between the supply voltage and the ground voltage. A method for measuring voltage, including receiving a plurality of voltages, detecting a maximum voltage from the plurality of voltages, maintaining the detected maximum voltage, and outputting the maintained detected maximum voltage.

Abstract translation: 一种用于测量电压的装置，包括用于检测多个电压并输出多个电压的最大电压的电压检测部分，接收来自电压检测部分的第一输出的电压锁存部分和接收电压检测部分的电压读取部分 来自电压锁存部分的第二输出。 用于测量电压的另一个装置，包括电源电压，接地电压以及在电源电压和接地电压之间并联连接的第一和第二电源电压测量单元。 一种用于测量电压的方法，包括接收多个电压，从多个电压检测最大电压，维持检测到的最大电压，并输出维持的检测到的最大电压。

公开(公告)号：US07747912B2

公开(公告)日：2010-06-29

申请号：US11774052

申请日：2007-07-06

Applicant: Sang-man Byun ,  Sang-cheol Kim ,  Jong-hyoung Lim ,  Gwan-pyo Hong

Inventor： Sang-man Byun ,  Sang-cheol Kim ,  Jong-hyoung Lim ,  Gwan-pyo Hong

IPC: G11C29/00

CPC classification number: G11C29/34 ,  G11C2029/2602

Abstract: A semiconductor memory device and related test method are disclosed. Test data is defined from a group of M test bits selected from either input data or corresponding output data. A parallel bit test is then conducted on the test data. The M test bits include N test bits, where N is less than M, selected on a bit by bit basis from the output data, and L test bits, where N+L=M, selected from the input data. The selection of input data may be made in accordance with a don't care case for selected test data.

Abstract translation: 公开了一种半导体存储器件及相关测试方法。 测试数据由从输入数据或相应输出数据中选择的一组M个测试位定义。 然后对测试数据进行并行比特测试。 M个测试位包括N个测试位，其中N小于M，从输出数据逐位选择，以及从输入数据中选择的L个测试位，其中N + L = M。 可以根据所选择的测试数据的不关心情况来进行输入数据的选择。