发明授权
US07034297B2 Method and system for use in the monitoring of samples with a charged particle beam
有权
用于监测带有带电粒子束的样品的方法和系统
- 专利标题: Method and system for use in the monitoring of samples with a charged particle beam
- 专利标题(中): 用于监测带有带电粒子束的样品的方法和系统
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申请号: US10382789申请日: 2003-03-05
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公开(公告)号: US07034297B2公开(公告)日: 2006-04-25
- 发明人: Igor Petrov , Zvika Rosenberg , Pavel Adamec , Igor Krayvitz
- 申请人: Igor Petrov , Zvika Rosenberg , Pavel Adamec , Igor Krayvitz
- 申请人地址: IL Rehovot
- 专利权人: Applied Materials, Israel, Ltd.
- 当前专利权人: Applied Materials, Israel, Ltd.
- 当前专利权人地址: IL Rehovot
- 代理商 Tarek N. Fahmi
- 主分类号: G21G5/00
- IPC分类号: G21G5/00 ; G01R31/28 ; H01J37/28 ; H01J37/26
摘要:
A method and apparatus for use in monitoring a sample with a charged particle beam are presented. A mechanical displacement between a plane defined by the sample's surface and an optical axis defined by a beam directing arrangement is provided so as to orient the sample at a certain non-right angle θ1 with respect to the optical axis. A primary charged particle beam propagating towards the sample is deflected so as to affect the trajectory of the primary charged particle beam to provide a certain non-zero angle θ2 between the primary beam propagation axis and said optical axis.
公开/授权文献
信息查询
IPC分类:
G | 物理 |
G21 | 核物理;核工程 |
G21G | 化学元素的转变;放射源 |
G21G5/00 | 通过化学反应进行化学元素的推断转变 |