发明授权
US07034297B2 Method and system for use in the monitoring of samples with a charged particle beam 有权
用于监测带有带电粒子束的样品的方法和系统

Method and system for use in the monitoring of samples with a charged particle beam
摘要:
A method and apparatus for use in monitoring a sample with a charged particle beam are presented. A mechanical displacement between a plane defined by the sample's surface and an optical axis defined by a beam directing arrangement is provided so as to orient the sample at a certain non-right angle θ1 with respect to the optical axis. A primary charged particle beam propagating towards the sample is deflected so as to affect the trajectory of the primary charged particle beam to provide a certain non-zero angle θ2 between the primary beam propagation axis and said optical axis.
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