发明授权
US07039832B2 Robust system reliability via systolic manufacturing level chip test operating real time on microprocessors/systems
失效
稳定的系统可靠性通过收缩制造级芯片测试在微处理器/系统上的实时操作
- 专利标题： Robust system reliability via systolic manufacturing level chip test operating real time on microprocessors/systems
- 专利标题（中）： 稳定的系统可靠性通过收缩制造级芯片测试在微处理器/系统上的实时操作
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申请号： US10313329申请日： 2002-12-05
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公开(公告)号： US07039832B2公开(公告)日： 2006-05-02
- 发明人: Ravi Kumar Arimilli , Robert Alan Cargnoni , Guy Lynn Guthrie , William John Starke
- 申请人： Ravi Kumar Arimilli , Robert Alan Cargnoni , Guy Lynn Guthrie , William John Starke
- 申请人地址： US NY Armonk
- 专利权人： International Business Machines Corporation
- 当前专利权人： International Business Machines Corporation
- 当前专利权人地址： US NY Armonk
- 代理机构： Dillon & Yudell LLP
- 代理商 Casimer K. Salys
- 主分类号： G06F11/00
- IPC分类号： G06F11/00
摘要：
A method and system are disclosed for running a manufacturing-level test program on an installed processor by interrupting processor execution of a non-test process. Periodic execution of the manufacturing-level test program allows the processor to continually self-test during normal function operation, in order to facilitate proper maintenance and function of the processor and a data processing system of which the processor is a part.
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