Invention Grant
- Patent Title: Reference gauge for calibrating a measuring machine and method for calibrating a measuring machine
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Application No.: US10314832Application Date: 2002-12-09
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Publication No.: US07043846B2Publication Date: 2006-05-16
- Inventor: Pascal Jordil , Charles-Henri Zufferey , Adriano Zanier
- Applicant: Pascal Jordil , Charles-Henri Zufferey , Adriano Zanier
- Applicant Address: CH Renens
- Assignee: Tesa SA
- Current Assignee: Tesa SA
- Current Assignee Address: CH Renens
- Agency: Pearne & Gordon LLP
- Priority: EP01811220 20011212
- Main IPC: G01B3/30
- IPC: G01B3/30 ; G01B3/32

Abstract:
Reference gauge for calibrating measuring machines whose reference dimension can be measured both on its inner size and by its outer size, thus making it possible to keep the reference dimension less than 15 millimeters, even for calibrating measuring machines equipped with probe tips having a diameter greater than that dimension. The calibration method with the aid of such a reference gauge comprises in certain cases the measuring of the calibrated distance between two outer surfaces of a protruding volume.
Public/Granted literature
- US20030106229A1 Reference gauge for calibrating a measuring machine and method for calibrating a measuring machine Public/Granted day:2003-06-12
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