- 专利标题: Reference gauge for calibrating a measuring machine and method for calibrating a measuring machine
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申请号: US10314832申请日: 2002-12-09
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公开(公告)号: US07043846B2公开(公告)日: 2006-05-16
- 发明人: Pascal Jordil , Charles-Henri Zufferey , Adriano Zanier
- 申请人: Pascal Jordil , Charles-Henri Zufferey , Adriano Zanier
- 申请人地址: CH Renens
- 专利权人: Tesa SA
- 当前专利权人: Tesa SA
- 当前专利权人地址: CH Renens
- 代理机构: Pearne & Gordon LLP
- 优先权: EP01811220 20011212
- 主分类号: G01B3/30
- IPC分类号: G01B3/30 ; G01B3/32
摘要:
Reference gauge for calibrating measuring machines whose reference dimension can be measured both on its inner size and by its outer size, thus making it possible to keep the reference dimension less than 15 millimeters, even for calibrating measuring machines equipped with probe tips having a diameter greater than that dimension. The calibration method with the aid of such a reference gauge comprises in certain cases the measuring of the calibrated distance between two outer surfaces of a protruding volume.
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