发明授权
- 专利标题: Three dimensional high aspect ratio micromachining
- 专利标题(中): 三维高宽比微加工
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申请号: US10607838申请日: 2003-06-27
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公开(公告)号: US07045466B2公开(公告)日: 2006-05-16
- 发明人: Kanakasabapathi Subramanian , Xiaojun T. Huang , Noel C. MacDonald
- 申请人: Kanakasabapathi Subramanian , Xiaojun T. Huang , Noel C. MacDonald
- 申请人地址: US NY Ithaca
- 专利权人: Cornell Research Foundation, Inc.
- 当前专利权人: Cornell Research Foundation, Inc.
- 当前专利权人地址: US NY Ithaca
- 代理机构: Schwegman, Lundberg, Woessner & Kluth, P.A.
- 主分类号: H01L21/302
- IPC分类号: H01L21/302
摘要:
Multi-level structures are formed in a semiconductor substrate by first forming a pattern of lines or structures of different widths. Width information on the pattern is decoded by processing steps into level information to form a MEMS structure. The pattern is etched to form structures having a first floor. The structures are oxidized until structures of thinner width are substantially fully oxidized. A portion of the oxide is then etched to expose the first floor. The first floor is then etched to form a second floor. The oxide is then optionally removed, leaving a multi-level structure. In one embodiment, high aspect ratio comb actuators are formed using the multi-level structure process.
公开/授权文献
- US20040198063A1 Three dimensional high aspect ratio micromachining 公开/授权日:2004-10-07
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