Invention Grant
- Patent Title: Method of measuring a physical function using a composite function which includes the physical function and an arbitrary reference function
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Application No.: US10645331Application Date: 2003-08-21
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Publication No.: US07050169B2Publication Date: 2006-05-23
- Inventor: Aydogan Ozcan , Michel J.F. Digonnet , Gordon S. Kino
- Applicant: Aydogan Ozcan , Michel J.F. Digonnet , Gordon S. Kino
- Applicant Address: US CA Palo Alto
- Assignee: The Board of Trustees of the Leland Stanford Junior University
- Current Assignee: The Board of Trustees of the Leland Stanford Junior University
- Current Assignee Address: US CA Palo Alto
- Agency: Knobbe, Martens, Olson & Bear, LLP
- Main IPC: G01N21/59
- IPC: G01N21/59

Abstract:
A method for measuring a physical function forms a symmetric composite function by combining the physical function with a reference function. The method obtains a Fourier transform of the symmetric composite function. The method calculates an inverse Fourier transform of the obtained Fourier transform, wherein the calculated inverse Fourier transform provides information regarding the physical function. The physical function can be a nonlinearity profile of a sample with at least one sample surface. The physical function can alternatively by a sample temporal waveform of a sample optical pulse.
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