发明授权
- 专利标题: Resistive memory device and method for making the same
- 专利标题(中): 电阻式存储器件及其制造方法
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申请号: US10695710申请日: 2003-10-29
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公开(公告)号: US07057258B2公开(公告)日: 2006-06-06
- 发明人: Lung T. Tran , Andrew L. Van Brocklin , Warren B. Jackson , Janice Nickel
- 申请人: Lung T. Tran , Andrew L. Van Brocklin , Warren B. Jackson , Janice Nickel
- 申请人地址: US TX Houston
- 专利权人: Hewlett-Packard Development Company, L.P.
- 当前专利权人: Hewlett-Packard Development Company, L.P.
- 当前专利权人地址: US TX Houston
- 主分类号: H01L29/00
- IPC分类号: H01L29/00
摘要:
A resistive cross point array memory device comprising a plurality of word lines extending in a row direction, a plurality of bit lines extending in a column direction such that a plurality of cross points is formed at intersections between the word and bit lines, and at least one memory element formed in at least one of the cross points. The memory element comprises a first tunnel junction having a bottom conductor, a top conductor, a barrier layer adjacent the bottom conductor, and wherein the bottom conductor comprises a non-uniform upper surface.
公开/授权文献
- US20050093092A1 Resistive memory device and method for making the same 公开/授权日:2005-05-05
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