- 专利标题: Large substrate test system
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申请号: US10901936申请日: 2004-07-29
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公开(公告)号: US07075323B2公开(公告)日: 2006-07-11
- 发明人: Matthias Brunner , Shinichi Kurita , Wendell T. Blonigan , Edgar Kehrberg
- 申请人: Matthias Brunner , Shinichi Kurita , Wendell T. Blonigan , Edgar Kehrberg
- 申请人地址: US CA Santa Clara
- 专利权人: Applied Materials, Inc.
- 当前专利权人: Applied Materials, Inc.
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Patterson & Sheridan LLP
- 主分类号: G01R31/26
- IPC分类号: G01R31/26
摘要:
A method and system for testing one or more large substrates are provided. In one or more embodiments, the system includes a testing chamber having a substrate table disposed therein. The substrate table is adapted to move a substrate within the testing chamber in various directions. More particularly, the substrate table includes a first stage movable in a first direction, and a second stage movable in a second direction, wherein each of the stages moves in an X-direction, Y-direction or both X and Y directions. The system further includes a load lock chamber at least partially disposed below the testing chamber, and a transfer chamber coupled to the load lock chamber and the testing chamber. In one or more embodiments, the transfer chamber includes a robot disposed therein which is adapted to transfer substrates between the load lock chamber and the testing chamber.
公开/授权文献
- US20060022694A1 Large substrate test system 公开/授权日:2006-02-02
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