A semiconductor memory device includes a plurality of memory blocks formed of a flash memory. The semiconductor memory device further includes a rewriting monitor circuit for memorizing the number of times of data rewriting in each of the memory blocks, and a switching circuit for switching a memory block selection address. When the number of times of rewriting in a first memory block which is a rewriting request object exceeds a predetermined value, data in a second memory block is transferred to the first memory block. Data to be written is written to the second memory block. Therefore, it is possible to increase the number of times of rewriting in the flash memory.