Invention Grant
US07106127B2 Temperature sensor and method for detecting trip temperature of a temperature sensor
有权
用于检测温度传感器跳闸温度的温度传感器和方法
- Patent Title: Temperature sensor and method for detecting trip temperature of a temperature sensor
- Patent Title (中): 用于检测温度传感器跳闸温度的温度传感器和方法
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Application No.: US10627693Application Date: 2003-07-28
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Publication No.: US07106127B2Publication Date: 2006-09-12
- Inventor: Jae-Yoon Sim , Jei-Hwan Yoo
- Applicant: Jae-Yoon Sim , Jei-Hwan Yoo
- Applicant Address: KR Suwon-Si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-Si
- Agency: Volentine Francos& Whitt, pllc
- Priority: KR2002-46993 20020809
- Main IPC: H01L35/00
- IPC: H01L35/00

Abstract:
A comparator circuit of a temperature sensor includes an output node and a variable current node. The output node is a first voltage at a given temperature when a current at the variable current node is less than a threshold current, and a different second voltage at the given temperature when the current at the variable current node is more than the threshold current. A variable resistance circuit includes at least n resistors of different resistive values connected in series between the variable current node of the comparator and a supply voltage, where n is an integer of 4 or more. A switching circuit is provided to selectively bypasses individual ones of the n resistors during a test sequence to determine a trip temperature of the sensor.
Public/Granted literature
- US20040071191A1 Temperature sensor and method for detecting trip temperature of a temperature sensor Public/Granted day:2004-04-15
Information query
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