发明授权
- 专利标题: Automatic testing system
- 专利标题(中): 自动测试系统
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申请号: US10753435申请日: 2004-01-09
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公开(公告)号: US07113882B2公开(公告)日: 2006-09-26
- 发明人: Ken-Ho Liu , Li-Ping Wang , Chang-Gen Mao , Hua-Liang Zhang
- 申请人: Ken-Ho Liu , Li-Ping Wang , Chang-Gen Mao , Hua-Liang Zhang
- 申请人地址: TW Taoyuan Sien
- 专利权人: Delta Eletronics, Inc.
- 当前专利权人: Delta Eletronics, Inc.
- 当前专利权人地址: TW Taoyuan Sien
- 代理机构: Birch, Stewart, Kolasch & Birch, LLP
- 优先权: TW92100395A 20030109
- 主分类号: G06F19/00
- IPC分类号: G06F19/00
摘要:
An automatic testing system. A sampling and converting device obtains a plurality of electronic parameters from a tested device and transforms them into a plurality of digital signals. A microprocessor receives the digital signals and performs various short-circuit tests, over-current tests and over-voltage tests in a specific sequence.
公开/授权文献
- US20040181355A1 Automatic testing system 公开/授权日:2004-09-16
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