发明授权
US07116145B2 Phase-locked loop circuit having phase lock detection function and method for detecting phase lock thereof
有权
具有相位锁定检测功能的锁相环电路及其相位锁定检测方法
- 专利标题: Phase-locked loop circuit having phase lock detection function and method for detecting phase lock thereof
- 专利标题(中): 具有相位锁定检测功能的锁相环电路及其相位锁定检测方法
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申请号: US10960367申请日: 2004-10-06
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公开(公告)号: US07116145B2公开(公告)日: 2006-10-03
- 发明人: Woo-Seok Kim , Phil-Jae Jeon
- 申请人: Woo-Seok Kim , Phil-Jae Jeon
- 申请人地址: KR
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR
- 代理机构: Mills & Onello LLP
- 优先权: KR10-2003-0069433 20031007
- 主分类号: H03L7/06
- IPC分类号: H03L7/06
摘要:
A phase-locked loop circuit including a lock detection function is disclosed. The phase-locked loop circuit comprises a lock detection circuit. The lock detection circuit includes a lock-detection-start-signal generator, a lock-detection-clock generator, and a lock-detection-signal generator. The lock-detection-start-signal generates a lock detection start signal when the pulse width of an up signal and a down signal reaches a predetermined value. The lock-detection-clock generator generates a lock detection clock signal on the basis of the up signal and the down signal. The lock-detection-signal generator counts the lock detection clock signal, and generates the lock detection signal. The phase-locked loop circuit is capable of discriminating the operating regions thereof and outputting a lock detection signal when the locking of phase is completed.
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