- 专利标题: Method for fabricating a self-aligning mask
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申请号: US10228886申请日: 2002-08-27
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公开(公告)号: US07125778B2公开(公告)日: 2006-10-24
- 发明人: Dirk Efferenn , Ulrike Grüning Von Schwerin , Hans-Peter Moll , Jörg Radecker , Andreas Wich-Glasen
- 申请人: Dirk Efferenn , Ulrike Grüning Von Schwerin , Hans-Peter Moll , Jörg Radecker , Andreas Wich-Glasen
- 申请人地址: DE Munich
- 专利权人: Infineon Technologies AG
- 当前专利权人: Infineon Technologies AG
- 当前专利权人地址: DE Munich
- 代理商 Laurence A. Greenberg; Werner H. Stemer; Ralph E. Locher
- 优先权: DE10141841 20010827
- 主分类号: H01L21/336
- IPC分类号: H01L21/336
摘要:
A description is given of a method for a selective masking of a structure with a small structure surface with respect to a structure with a larger structure surface. To that end, the structures are filled with a covering layer. The covering layer is formed with a larger thickness above the first structure, which has the larger structure surface, than above the second structure. Afterward, the covering layer is removed by a homogeneous removal method, so that first the structure surface of the second structure is uncovered. A simple self-aligning method for fabricating a mask for uncovering the second structure is thus provided.
公开/授权文献
- US20030040184A1 Method for fabricating a self-aligning mask 公开/授权日:2003-02-27
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