发明授权
- 专利标题: Fabrication method for microstructures with high aspect ratios
- 专利标题(中): 具有高纵横比的微结构的制造方法
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申请号: US10992709申请日: 2004-11-22
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公开(公告)号: US07125795B2公开(公告)日: 2006-10-24
- 发明人: Nai-Hao Kuo , Kai-Hsiang Yen , Jing-Hung Chiou , Po-Hao Tsai , Yuh-Wen Lee
- 申请人: Nai-Hao Kuo , Kai-Hsiang Yen , Jing-Hung Chiou , Po-Hao Tsai , Yuh-Wen Lee
- 申请人地址: TW Hsinchu
- 专利权人: Industrial Technology Research Institute
- 当前专利权人: Industrial Technology Research Institute
- 当前专利权人地址: TW Hsinchu
- 代理机构: Birch, Stewart, Kolasch & Birch, LLP
- 主分类号: H01L21/4763
- IPC分类号: H01L21/4763
摘要:
A fabrication method for microstructures with high aspect ratios uses a CMOS process to form a desired microstructure on a silicon substrate. The steps of forming a contact plug and a via plug of the process are used to form etching channels in insulation layers, polysilicon layers and metal layers, penetrating to the silicon substrate. An etching process is then performed through the etching channel to form the desired microstructure with high aspect ratio.
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