发明授权
US07136770B2 Using component-level calibration data to reduce system-level test
失效
使用组件级校准数据来减少系统级测试
- 专利标题： Using component-level calibration data to reduce system-level test
- 专利标题（中）： 使用组件级校准数据来减少系统级测试
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申请号： US10700831申请日： 2003-11-03
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公开(公告)号： US07136770B2公开(公告)日： 2006-11-14
- 发明人: Jochen Rivoir , John McLaughlin , Joseph M. Gorin , Moray Denham Rumney , Matthew Johnson , Robert Locascio , Peter J. Cain , David H. Molinari , George S. Moore
- 申请人： Jochen Rivoir , John McLaughlin , Joseph M. Gorin , Moray Denham Rumney , Matthew Johnson , Robert Locascio , Peter J. Cain , David H. Molinari , George S. Moore
- 申请人地址： US CA Santa Clara
- 专利权人： Agilent Technologies, Inc.
- 当前专利权人： Agilent Technologies, Inc.
- 当前专利权人地址： US CA Santa Clara
- 代理商 Robert T. Martin
- 主分类号： G01R31/00
- IPC分类号： G01R31/00 ; G01R31/14
摘要：
Using component-level test data to reduce system test. By modeling a system, sensitivity analysis reveals critical components and parameters of those components required to meet system performance parameters. Critical components are tested for these parameters, and these measurements associated with the components. Systems may be assembled which are modeled to meet the system performance parameters based on the model and the measured parameters. Systems may be assembled and calibration coefficients derived and applied from the model and the measured parameters.
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