发明授权
US07138645B2 Calibration pattern unit photographed by an imaging system to acquire an image for obtaining correction information
有权
由成像系统拍摄的校准图案单元，以获取用于获得校正信息的图像
- 专利标题： Calibration pattern unit photographed by an imaging system to acquire an image for obtaining correction information
- 专利标题（中）： 由成像系统拍摄的校准图案单元，以获取用于获得校正信息的图像
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申请号： US10650619申请日： 2003-08-28
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公开(公告)号： US07138645B2公开(公告)日： 2006-11-21
- 发明人: Kazuhiko Arai , Akio Kosaka , Takashi Miyoshi , Kazuhiko Takahashi , Hidekazu Iwaki
- 申请人： Kazuhiko Arai , Akio Kosaka , Takashi Miyoshi , Kazuhiko Takahashi , Hidekazu Iwaki
- 申请人地址： JP Tokyo
- 专利权人： Olympus Corporation
- 当前专利权人： Olympus Corporation
- 当前专利权人地址： JP Tokyo
- 代理机构： Scully, Scott, Murphy & Presser, PC
- 优先权： JP2002-251635 20020829
- 主分类号： G01C11/22
- IPC分类号： G01C11/22 ; G06K9/00 ; G01B7/00 ; F16M11/00
摘要：
A calibration pattern unit which obtains correction information of an imaging system by imaging at the imaging system is formed by combining a plurality of three-dimensionally arranged planes. The calibration pattern unit comprises supporting members each of which has a predetermined surface corresponding to one of the planes, and a calibration pattern in which a predetermined pattern is formed on the predetermined surface of the supporting member. The supporting member can selectively set the calibration pattern unit to a first form for photographing when the correction information is obtained, and a second form for other purposes.
公开/授权文献
- US20040044496A1 Calibration pattern unit 公开/授权日：2004-03-04