- 专利标题: Reverse magnetic reset to screen for weakly pinned heads
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申请号: US10955301申请日: 2004-09-30
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公开(公告)号: US07138797B2公开(公告)日: 2006-11-21
- 发明人: Ciaran Avram Fox , Kenneth David Mackay , Vladimir Nikitin
- 申请人: Ciaran Avram Fox , Kenneth David Mackay , Vladimir Nikitin
- 申请人地址: NL Amsterdam
- 专利权人: Hitachi Global Storage Technologies Netherlands, B.V.
- 当前专利权人: Hitachi Global Storage Technologies Netherlands, B.V.
- 当前专利权人地址: NL Amsterdam
- 代理机构: Intellectual Property Law Offices
- 代理商 Larry B. Guernsey
- 主分类号: G01R33/12
- IPC分类号: G01R33/12
摘要:
A method is disclosed for testing pinned layers of magnetic disk drive read heads having at least one pinned layer, where the magnetic orientation of the pinned layers has been set in an initial direction. The method includes applying a large magnetic test field at a reverse canted reset angle. First test responses from the disk drive read heads are then measured in a small magnetic test field. A large magnetic test field is applied at normal canted reset angle. The disk drive heads are then subjected to a full suite of performance tests in a small magnetic test field to verify their acceptability. These second test responses are then compared to the first test responses to identify read heads having weakly pinned layers.
公开/授权文献
- US20060066299A1 Reverse magnetic reset to screen for weakly pinned heads 公开/授权日:2006-03-30
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